Application Note Application Note AN101

Application Note AN101 Retronix Curve Trace Test Capability Retronix is at the forefront of counterfeit IC detection and uses curve tracing as a primary way to validate the electrical condition of any an semiconductor device which is analysed for authenticity or basic functionality. A variety of curve tracing techniques allow us to confirm basic facts about a suspect device. The basic concept is that each pin possesses a characteristic Voltage-Current relationship elationship unique to the electrical structure and manufacturing process used to make the device. Collectively, this set of curve traces form a data set analogous to a fingerprint. Like real fingerprints, curve traces can be compared to other unknown and known device signatures and evaluated for a match. Curve tracing can be used to evaluate any semiconductor process technology and any device function regardless of pin count. For example, curve tracing each pin with respect to all other pins grounded can indicate the distribution of power pins for a particular device. The operator can then compare that to datasheets to validate the most basic fact, its Pinout (or footprint). Further analysis allows us to obtain electrical signatures for all pins of any device and compare them to others. When a “Known Good Device” (KGD) is available, this method gives very high confidence that the pinout not only matches the datasheet and other devices but also that no pins have gross electrical damage like opens, shorts or leakage which may degrade or prevent functioning of the device. Through the use of additional test conditions, we can multiply this confidence. Comparison to a reliable datasheet is essential when no KGD is available. Retronix also possesses the unique unique ability to power up the device during curve tracing and directly measure the majority of parameters in the DC specifications table of typical datasheets. Most importantly, the supply current can be measured under static test conditions allowing an unprecedented cedented level of confidence that the device is connected correctly and does not have additional defects that might result in high supply current. This is particularly particularly important for battery powered devices which depend on low IDDQ so that batteries do not die prematurely. Furthermore, in the powered state, the difference between Input, Output, I/O and Analog pins becomes evident allowing for 100% confidence that a particular device matches the pinout published in the datasheet. While these methods fall short short of a full speed full functional test, Curve Tracing is the best alternative to the high cost of ATE testers, test vector generation, and test engineering NRE.. Curve tracing can find the majority of fake and damaged devices with very good confidence. Other Electrical Testing In addition to automated curve trace testing, Retronix can also perform certain Key Functional Tests on ICs, measuring performance against datasheet parameter specs, and has the capability to accurately test other components including includ passives.

AN101 Retronix Curve Trace Test Capability

1

JMc Jan ‘13

Application Note AN101

Fig 1. Curve Trace Test Screenshot (Good Device on Left) eft)

Fig 2. Curve Trace Tester

AN101 Retronix Curve Trace Test Capability

2

JMc Jan ‘13