DXC Late Announcements TXRF Late Announcements

DXC Late Announcements Poster Sessions Monday XRD Additional Poster: Quantifying the Multiscale Mechanics of Advanced Materials Using High Energy Diffraction Microscopy A.N. Bucsek, A.P. Stebner, Colorado School of Mines, Golden, CO, USA Tuesday Stress, Additional Instructors: C.E. Murray, IBM T.J. Watson Research Center, Yorktown Heights, NY, USA, [email protected] T.R. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN, [email protected] Wednesday New Developments in XRD/XRF Instrumentation, Withdrawn Talk: 1:30 The STOE STADI P with Ag K α1-radiation – Highest Versatility for XRD and PDF T. Hartmann, STOE & Cie GmbH, Darmstadt, Germany Thursday Applied Materials, Title Confirmed: 10:40 Invited - The Development and Application of New In-situ / Time-Resolved Technologies for Structural Interrogation from the Atomic through Near-Visible Size Scales B.Landes*, M. Behr, S. Rozeveld, The Dow Chemical Company, Midland, MI, USA J. Rix, S. Weigand, D. Keane, Northwestern University, APS/ANL, Argonne, IL, USA Environmental & Geological Apps, New presenter (*indicates presenter): 4:10 The Application of SumXcore Technology to Improve the Analysis of Geological Materials A. Komelkov, Y. Xiao, C. Tsouris, , B. Vrebos*, PANalytical B.V., Almelo, The Netherlands Friday

TXRF Late Announcements Wednesday