Optical Enhancement in Optoelectronic Devices using Refractive ...
Supporting Information
Optical Enhancement in Optoelectronic Devices using Refractive Index Grading Layers Illhwan Leea, Jae Yong Parka, Seungo Gima, Kisoo Kima*, Sang-Hwan Chob, Chung Sock Choib, SeungYong Songb, and Jong-Lam Lee*a
a
Department of Materials Science and Engineering, Division of Advanced Materials Science, Pohang
University of Science and Technology (POSTECH), Pohang, Gyeongbuk, 790-784, Korea b
Samsung Display Co., LTD., Giheung-Gu, Yongin-City, 446-711, Korea
a*
Present address: POSCO, Pohang, Gyeongbuk, 37859, Korea
*E-mail : [email protected]
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Figure S1. Calculated transmittance spectrum of NON structures as a function of wavelength. (a) The transmittance is calculated according to the thickness of (a) SixNy and (b) SiO2 layers, when thicknesses of SiO2 and SixNy are to be 270 (3λ / 4n) and 330 (5λ / 4n) nm. The calculation of average transmittance according to the thickness of (c) SixNy and (d) SiO2.
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Figure S2. (a) Schematic explanation of the measurement for the angular distribution. The OLED and barrier films were prepared on the glass substrates, separately. The bare glass, GR (NONON with RIGL), and NGR (NONON) samples (glass side) were attached on the back side of the OLED (glass side) using a sample holder allowing the samples to cling the OLED without any adhesive. We measured the luminance as a function of viewing angle from -70° to 70° (J = 30 mA/cm2). (b) The current density - voltage characteristics of OLED with the bare glass, GR, and NGR samples after finishing the measurement of angular distribution. We used the same OLED device which is not degraded during the measurement of angular distribution.
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Figure S3. The normalized EL spectra of (a) bare glass, (b) NGR, and (c) GR samples as a function of viewing angle from 0° to 70°. Injected J was set as constant 30 mA/cm2.
S-4
Figure S4. Contour plot of the simulated angle-resolved transmittance of the bare glass, NGR, and GR structures under (a, b, c) TE-polarized and (e, f, g) TM-polarized light. The averaged transmittance under (d) TE-polarized and (h) TM-polarized light.
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Figure S5. Cross-sectional square of the electric field distributions of (a, b) NGR and (c, d) GR structures. The (a, c) horizontal and (b, d) vertical dipole were used.
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Optical Enhancement in Optoelectronic Devices using Refractive Index Grading Layers Illhwan Leea, Jae Yong Parka, Seungo Gima, Kisoo Kima*, Sang-Hwan Chob, Chung Sock Choib, SeungYong Songb, and Jong-Lam Lee*a
a
Department of Materials Science and Engineering, Division of Advanced Materials Science, Pohang
University of Science and Technology (POSTECH), Pohang, Gyeongbuk, 790-784, Korea b
Samsung Display Co., LTD., Giheung-Gu, Yongin-City, 446-711, Korea
a*
Present address: POSCO, Pohang, Gyeongbuk, 37859, Korea
*E-mail : [email protected]
S-1
Figure S1. Calculated transmittance spectrum of NON structures as a function of wavelength. (a) The transmittance is calculated according to the thickness of (a) SixNy and (b) SiO2 layers, when thicknesses of SiO2 and SixNy are to be 270 (3λ / 4n) and 330 (5λ / 4n) nm. The calculation of average transmittance according to the thickness of (c) SixNy and (d) SiO2.
S-2
Figure S2. (a) Schematic explanation of the measurement for the angular distribution. The OLED and barrier films were prepared on the glass substrates, separately. The bare glass, GR (NONON with RIGL), and NGR (NONON) samples (glass side) were attached on the back side of the OLED (glass side) using a sample holder allowing the samples to cling the OLED without any adhesive. We measured the luminance as a function of viewing angle from -70° to 70° (J = 30 mA/cm2). (b) The current density - voltage characteristics of OLED with the bare glass, GR, and NGR samples after finishing the measurement of angular distribution. We used the same OLED device which is not degraded during the measurement of angular distribution.
S-3
Figure S3. The normalized EL spectra of (a) bare glass, (b) NGR, and (c) GR samples as a function of viewing angle from 0° to 70°. Injected J was set as constant 30 mA/cm2.
S-4
Figure S4. Contour plot of the simulated angle-resolved transmittance of the bare glass, NGR, and GR structures under (a, b, c) TE-polarized and (e, f, g) TM-polarized light. The averaged transmittance under (d) TE-polarized and (h) TM-polarized light.
S-5
Figure S5. Cross-sectional square of the electric field distributions of (a, b) NGR and (c, d) GR structures. The (a, c) horizontal and (b, d) vertical dipole were used.
S-6
