Ossila FACT1
Ossila FACT1 Ossila is pleased to announce the availability of our FACT1 mobility measurement system - designed especially for materials screening and optimisation, by chemists, materials scientists and physicists. By utilising prefabricated test chips and custom designed hardware/software the FACT system makes the measurement of mobility via field-effect transistors, a simple process that can be performed in any laboratory without specialist training. The measurement of mobility is a key factor in the screening and optimisation of materials for a wide variety of applications including OLEDs, OPVs and OFETs. However, until now this has usually required time consuming fabrication and complicated measurements requiring expert knowledge.
Typical Specifications Computer
Desktop computer with Core i5 processor, Windows 7 64 bit and 8 GB RAM
Control system
Custom designed Ossila Virtual Instrument for OFET measurements over PXI system using compiled LabView
PXI system configuration
National instruments PXI chassis and control board driving dual source-measure cards for high voltage (up to ±100V ) and high precision measurements (down to 10 nA)
Enclosure
Custom built aluminium/steel/Perspex enclosure with interlock systems Clip-fit substrate holder for a robust and simple to use electro-mechanical interface Custom build electronics provide automated switching between the individual OFETs while provide excellent isolation at the high voltages and high precision required for OFET measurements
Electromechanical Interface Control circuitry
No more probe stations... Simply insert a test chip into the system and start the program to perform output and/or transfer sweeps and automatically calculate the key parameters. Each test chip has five individual OFETs, allowing statistical data to be built up easily. Two different test chip architectures are available for screening a variety of materials including polymers and small molecules.
Contact us to find out more: Call: 0114 213 2770 Ossila Ltd
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Email: [email protected] www.ossila.com
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[email protected]
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+44 (0)114 213 2770
Typical Specifications Computer
Desktop computer with Core i5 processor, Windows 7 64 bit and 8 GB RAM
Control system
Custom designed Ossila Virtual Instrument for OFET measurements over PXI system using compiled LabView
PXI system configuration
National instruments PXI chassis and control board driving dual source-measure cards for high voltage (up to ±100V ) and high precision measurements (down to 10 nA)
Enclosure
Custom built aluminium/steel/Perspex enclosure with interlock systems Clip-fit substrate holder for a robust and simple to use electro-mechanical interface Custom build electronics provide automated switching between the individual OFETs while provide excellent isolation at the high voltages and high precision required for OFET measurements
Electromechanical Interface Control circuitry
No more probe stations... Simply insert a test chip into the system and start the program to perform output and/or transfer sweeps and automatically calculate the key parameters. Each test chip has five individual OFETs, allowing statistical data to be built up easily. Two different test chip architectures are available for screening a variety of materials including polymers and small molecules.
Contact us to find out more: Call: 0114 213 2770 Ossila Ltd
I
I
Email: [email protected] www.ossila.com
I
[email protected]
I
+44 (0)114 213 2770
