The nGauge Atomic Force Microscope: A microscopic microscope for ...
icspi
The nGauge Atomic Force Microscope: A microscopic microscope for the masses
Integrated Circuit Scanning Probe Instruments www.icspicorp.com
Introducing the world’s first Single-Chip Dynamic Atomic Force Microscope: smaller, faster, better. ICSPI (pronounced: icy-spy) has integrated all of the mechatronic systems that are used in conventional AFM’s onto a single CMOS chip. The result is the nGauge system, an AFM that has been volumetrically scaled by a factor of 1 million. We produce versatile instruments with superior vibration immunity, less drift, and an extremely low price point when compared to the state-of-the-art.
a)
b)
Key Features and Benefits • Our integrated thermal piezoresistive resonant cantilevers make it possible to exchange tips and start imaging in less than a minute (no lasers to align) • Thermal proximity sensors allow for a completely automated approach in seconds • Electrothermal MEMS actuators precisely move the cantilever tip with low drift, enabling long-term imaging experiments
c)
• The small size of the nGauge AFM rejects building vibrations, so our system images robustly on any table top • An aluminum oxide tip images consistently without noticeable tip wear for over 10,000 images e)
f)
• Costs 100x less than many high-end AFMs, with no compromise in quality • Intuitive, cross-platform software designed with the most novice user in mind, with advanced features readily accessible
a) Butterfly wing, b) Carbon nanotubes, c) Cellulose nanocrystals, d) 22 nm SRAM, e) Collagen, f) DVD bits Images taken with nGauge AFM
Integrated Circuit Scanning Probe Instruments www.icspicorp.com 248 Corrie Crescent, Waterloo, ON, Canada N2L 6E1 email: [email protected]
AFM Specifications
Hardware Specifications
Maximum Scan Range (XYZ)
15 µm x 15 µm x 10 µm
System Dimensions (LWH)
70 mm x 90 mm x 75 mm
XY Scanner Resolution
19 bits)*
Communication
USB
Power Supply
100-240 VAC to 7.5VDC
* Effective number of bits (ENOB) over 3.3V full-scale
Software Specifications Control Parameters
• • • • • • • •
Approach
Manual and Automatic
Image Pixels
16 x 16 à 1024 x 1024
Image Outputs
Topo (Forward/Reverse) Phase (Forward/Reverse) Error (Forward/Reverse)
Force Curve
Dynamic
Open Source
Yes
OS Requirements
Windows, OS X
Single-chip atomic force microscope with integrated sensors, actuators and tip
Image anywhere and everywhere with the nGauge AFM
Set Point PID Settings Scan Range Scan Rate Frequency Amplitude Tip Height Tip Bias
Integrated Circuit Scanning Probe Instruments www.icspicorp.com 248 Corrie Crescent, Waterloo, ON, Canada N2L 6E1 email: [email protected]
The nGauge Atomic Force Microscope: A microscopic microscope for the masses
Integrated Circuit Scanning Probe Instruments www.icspicorp.com
Introducing the world’s first Single-Chip Dynamic Atomic Force Microscope: smaller, faster, better. ICSPI (pronounced: icy-spy) has integrated all of the mechatronic systems that are used in conventional AFM’s onto a single CMOS chip. The result is the nGauge system, an AFM that has been volumetrically scaled by a factor of 1 million. We produce versatile instruments with superior vibration immunity, less drift, and an extremely low price point when compared to the state-of-the-art.
a)
b)
Key Features and Benefits • Our integrated thermal piezoresistive resonant cantilevers make it possible to exchange tips and start imaging in less than a minute (no lasers to align) • Thermal proximity sensors allow for a completely automated approach in seconds • Electrothermal MEMS actuators precisely move the cantilever tip with low drift, enabling long-term imaging experiments
c)
• The small size of the nGauge AFM rejects building vibrations, so our system images robustly on any table top • An aluminum oxide tip images consistently without noticeable tip wear for over 10,000 images e)
f)
• Costs 100x less than many high-end AFMs, with no compromise in quality • Intuitive, cross-platform software designed with the most novice user in mind, with advanced features readily accessible
a) Butterfly wing, b) Carbon nanotubes, c) Cellulose nanocrystals, d) 22 nm SRAM, e) Collagen, f) DVD bits Images taken with nGauge AFM
Integrated Circuit Scanning Probe Instruments www.icspicorp.com 248 Corrie Crescent, Waterloo, ON, Canada N2L 6E1 email: [email protected]
AFM Specifications
Hardware Specifications
Maximum Scan Range (XYZ)
15 µm x 15 µm x 10 µm
System Dimensions (LWH)
70 mm x 90 mm x 75 mm
XY Scanner Resolution
19 bits)*
Communication
USB
Power Supply
100-240 VAC to 7.5VDC
* Effective number of bits (ENOB) over 3.3V full-scale
Software Specifications Control Parameters
• • • • • • • •
Approach
Manual and Automatic
Image Pixels
16 x 16 à 1024 x 1024
Image Outputs
Topo (Forward/Reverse) Phase (Forward/Reverse) Error (Forward/Reverse)
Force Curve
Dynamic
Open Source
Yes
OS Requirements
Windows, OS X
Single-chip atomic force microscope with integrated sensors, actuators and tip
Image anywhere and everywhere with the nGauge AFM
Set Point PID Settings Scan Range Scan Rate Frequency Amplitude Tip Height Tip Bias
Integrated Circuit Scanning Probe Instruments www.icspicorp.com 248 Corrie Crescent, Waterloo, ON, Canada N2L 6E1 email: [email protected]
