Wizzler 400 datasheet 1

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WIZZLER

400

Femtosecond pulse measurement device Self-Referenced Spectral Interferometry Single shot, single beam Extreme ease of use Direct retrieval algorithm Real time operation Data logging The Wizzler is a new tool for ultrashort pulse characterization based on Self-Referenced Spectral Interferometry. In this new technique invented and patented by FASTLITE, a reference pulse with a flat spectral phase is collinearly generated from the input pulse by cross-polarized wave generation (XPW). A non-integrative processing of the spectral interference pattern resulting from the combination of the input pulse and the reference pulse allows direct retrieval of the spectral phase and intensity.

Phone: Fax: E-mail:

+33 (0)1 45 30 12 96 +33 (0)1 45 30 12 97 [email protected]

www.fastlite.com

FASTLITE

45 rue Croulebarbe 75013 PARIS FRANCE

WIZZLER

400

Femtosecond pulse measurement device Specifications: • Spectral band edges • Pulse bandwidth range

390-410nm 2,5-7nm

FWHM values for FTL Gaussian pulses

• Pulse duration

35-100fs

FWHM values for FTL Gaussian pulses

• Temporal measurement range • Temporal measurement dynamic

±400fs 40dB

For shorter pulses or other wavelengths, please contact us.

Experimental data:

0.6 0.5 0.4 0.3

1E+0

2.0

1E-1

1.0 0.0

-1.0

1E-7 0 100 -400 -300 -200 -100 Time (fs)

Focusing mirror

PC: • Windows XP, 7 • USB 2.0 port Dimensions:

1E-4

1E-6

Requirements: linear 3mm 80-160mm 2-20µJ

1E-3

1E-5

0.2 -2.0 0.1 0.0 -3.0 390 392 394 396 398 400 402 404 406 408 410 Wavelength (nm)

Input pulse: • Polarization • Beam diameter • Beam Height • Min/Max energy

FTL Measured

1E-2 Intensity

0.7

3.0

Spectral phase (rad)

Spectral Intensity (a.u)

1.0 0.9 0.8

50fs, 400nm pulse measurement

iris

polarizer

200

300

400

Waveplate /2

iris

XPW crystal pre-delay

polarizer

spectrometer

Focusing mirror

260

260x110mm

© FASTLITE 2010. Product specifications are subject to change at any time without prior notice

110

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