WIZZLER
400
Femtosecond pulse measurement device Self-Referenced Spectral Interferometry Single shot, single beam Extreme ease of use Direct retrieval algorithm Real time operation Data logging The Wizzler is a new tool for ultrashort pulse characterization based on Self-Referenced Spectral Interferometry. In this new technique invented and patented by FASTLITE, a reference pulse with a flat spectral phase is collinearly generated from the input pulse by cross-polarized wave generation (XPW). A non-integrative processing of the spectral interference pattern resulting from the combination of the input pulse and the reference pulse allows direct retrieval of the spectral phase and intensity.
Phone: Fax: E-mail:
+33 (0)1 45 30 12 96 +33 (0)1 45 30 12 97
[email protected] www.fastlite.com
FASTLITE
45 rue Croulebarbe 75013 PARIS FRANCE
WIZZLER
400
Femtosecond pulse measurement device Specifications: • Spectral band edges • Pulse bandwidth range
390-410nm 2,5-7nm
FWHM values for FTL Gaussian pulses
• Pulse duration
35-100fs
FWHM values for FTL Gaussian pulses
• Temporal measurement range • Temporal measurement dynamic
±400fs 40dB
For shorter pulses or other wavelengths, please contact us.
Experimental data:
0.6 0.5 0.4 0.3
1E+0
2.0
1E-1
1.0 0.0
-1.0
1E-7 0 100 -400 -300 -200 -100 Time (fs)
Focusing mirror
PC: • Windows XP, 7 • USB 2.0 port Dimensions:
1E-4
1E-6
Requirements: linear 3mm 80-160mm 2-20µJ
1E-3
1E-5
0.2 -2.0 0.1 0.0 -3.0 390 392 394 396 398 400 402 404 406 408 410 Wavelength (nm)
Input pulse: • Polarization • Beam diameter • Beam Height • Min/Max energy
FTL Measured
1E-2 Intensity
0.7
3.0
Spectral phase (rad)
Spectral Intensity (a.u)
1.0 0.9 0.8
50fs, 400nm pulse measurement
iris
polarizer
200
300
400
Waveplate /2
iris
XPW crystal pre-delay
polarizer
spectrometer
Focusing mirror
260
260x110mm
© FASTLITE 2010. Product specifications are subject to change at any time without prior notice
110