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United States Patent [19] Hudson, Jr. et al. [54] DIGITAL REGISTERS‘WITH SERIAL ACCESSED MODE CONTROL 131T

F33615-84_C-1500, May 1985,

Michael L- Kalm, Spring Lake, both 0f Minn‘

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Bhavsar, Self-Testing by Polynomial Division, Digest

of Papers-1981 Intl. Test Conf., IEEE, pp. 208-216.

Fasting, Circuit Module Implements Practical Self-T

_

[51] [52] [53]

esting, Electronics, vol. 88, No. 1557, May 19, 1982, pp.

Int. Cl.4 ........................................... .. G01R 31/28 U.S. Cl. ...................................... .. 371/25 Field of Search ............... .. 371/15, 25; 324/73 R,

324/73 AT

[56]

References Cited U S PATENT DOCUMENTS

1;; ,

Primary Examiner--Charles E. Atkinson Attorney, Agent, or Firm—W. T. Udseth

[57] ABSTRACT A recon?gurable digital register that can be serially loaded has an additional bit associated with the register which holds information indicative of a mode of opera

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Konemann et al., Built-In Test for Complex Digital Integrated Circuits, IEEE Journal of Solid-State Cir cuits, vol. SC-15, No. 3, Jun. 1980, pp. 315-319.

[73] Asslgnw Honeywell Inc-i Mlnneapolls, Mmn[21] APP1-N°-= 89,381 [22]

Jul. 11, 1989

OTHER PUBLICATIONS Project Status Report VHSIC Phase 2, Contract No.

[75] Inventors: Charles L. Hudson, Jr., Plymouth; _

4,847,839

Patent Number: Date of Patent:

[11] [45]

tion of the register. The mode control bit is located such

gaeusele -------------------------- ercy

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that it can be serially loaded along with the other bits. A pamc-ula?y useful embodlm-em ‘5 to 956 the mode con -

4,513,418 4/1985 Bardell, Jr. et a1.

371/25

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4,519,078

5/1985

4,594,711

6/1986 Thatte .......... ..

371/25

trol blt to con?gure the register. as either a. test pattern . . generator 01: a §1gnamre analysls reglste‘ “1 suppo" of

4,601,034

7/1986 Sridhar ......... ..

371/25

mtegfated clrcu“ Self-test functlons

Komonytsky ....... ..

371/25

4,701,916 10/1987 Naven et a1. 371/15 4,703,484 10/ 1987 Rolfe et a1. ......................... .. 371/25

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