Radiation Data
Radiation Data
APPLICATION NOTES QTAN‐110
SPACE PRODUCTS HISTORY Q-Tech Corporation was founded in 1972 a manufacturer of high reliability hybrid clock oscillators. In 1985, Q-Tech decided to enter the Space applications market and received its first order for the MILSTAR program. In fact, Q-Tech went on to receive the TRW “Supplier of the Year Award” for the next two years in a row. In 1994, Q-Tech became the major supplier of hybrid crystal oscillators to virtually every satellite manufacturer in the United States. In 1999, Q-Tech received JPL/NASA award for its contribution to the Cassini program. Today up to date 2014, Q-Tech has 29 years serving the Space market and has grown far with design experience, excellent quality, numerous records of flight history, and lots of new products launched.
Page | 2
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Q-TECH RADIATION HARDNESS ASSURANCE PLAN 1.0 QUALIFICATION 1.1 All active EEE components possessed radiation (Total Ionizing Dose, Displacement Damage, and Single Event Effects) characterization data on parts representative of the flight lot devices in the flight application.
2.0 TOTAL IONIZING DOSE TESTING 2.1 Total Ionizing dose (TID) is the absorbed dose in a given material resulting from the energy deposition of ionizing radiation. TID is a measure of the energy deposited in a medium by ionizing radiation per unit mass. 2.2 Total Ionizing dose (TID) is a long-term failure mechanism versus SEE which is an instantaneous failure mechanism. 2.3 Total Ionizing dose testing is conducted in accordance with MIL-STD-883 test method 1019.7 or MIL-STD-750 test method 1019.5. 2.4 Test conditions represent the worst-case conditions in the intended application, typically 2X margin. 2.5 For linear bipolar integrated circuits and semiconductors which are potentially ELDRS-susceptible devices, test is conducted at 0.001Rad(Si)/s to 0.1Rad(Si)/s up to 50kRad(Si) or 100kRad(Si), both powered and unpowered.
Page | 3
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
3.0 DISPLACEMENT DAMAGE TESTING 3.1 Displacement damage (DD) is the result of nuclear interactions, typically scattering, which cause lattice defects. Protons can cause displacement damage in bipolar devices. Displacement damage is due to cumulative long-term non-ionizing dose damage from protons, electrons, and neutrons. The collision between an incoming particle and a lattice atom subsequently displaces the atom from its original lattice position. 3.2 Displacement damage testing is conducted in accordance with MIL-STD-750 test method 1017.1 or MIL-STD-883 test method 1017.2. 3.3 Neutron displacement damage or Proton displacement damage can be characterized with conversion to the equivalent 1MeV neutron damage fluence.
4.0 COMBINED TOTAL IONIZING DOSE AND DISPLACEMENT DAMAGE EFFECTS 4.1 If separate samples are used for total ionizing dose and displacement damage, the effects are combined analytically as described in MIL-HBK-814. 4.2 The samples may be used for both displacement damage and ionizing dose testing provided displacement damage (neutron) testing is done prior to total ionizing dose testing.
5.0 PARTS DEGRADED DESIGN LIMITS 5.1 Parts degraded design limits of data shall be based on MIL-HBK-814 to ensure that the lots will meet a 0.99/90 (99% of the population at 90% confidence level) statistical criteria. Special GPSIII design limits required a 0.9999/90 (99.99% and 90% confidence).
6.0 SINGLE EVENT EFECTS (SEE) TESTING 6.1 Active EEE components used in space orbits that are potentially susceptible to single event effects are required data tested adequate to calculate the single event effects rate in the intended applications. 6.2 A single event effect (SEE) is a disturbance to the normal operation of a circuit caused by the passage of a single ion through or near a sensitive node in a circuit. SEE can be either destructive or non-destructive. Destructive SEE include single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR). Non-destructive SEE include single-event upsets (SEU), single-event transients (SET), and single-event functional interrupts (SEFI). 6.3 Heavy ions testing for single event latch-up, burnout, transient, and upset. Appropriate bias and operating conditions: worst-case biasing and temperature for latchup, burnout. For single event upset, transient, the bias and operating conditions are lowest operating voltage and room temperature ambient. 6.4 Energy loss measure – Linear Energy Transfer (LET): Measure of energy deposition in a material, e.g. silicon. Unit of LET is MeV per mg/cm2 (energy per areal density). 6.5 Cross section is a measure of susceptibility, and unit is cm2 (area).
Page | 4
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Page | 5
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Q-TECH DESIGN CRITERIA TO MEET RADIATION SPECIFICATION LIMITS 1.0 Review each of the customers’ Radiation Hardness requirements. Try to ensure mission parameters such as reliability, availability, operate-through, and lifetime are met. See examples in Figures below. 2.0 Personnel involved included radiation engineer, reliability engineer, component engineer, and design engineer. 3.0 Apply design guidelines and derating for Radiation assurance margin. 4.0 Procure EEE active components with RHA level adequate for the application. Searches for available radiation hardened components that meet the requirement. Searches for commercial alternatives that could be up screened. 5.0 Obtain radiation test data from supplier on components level. Additional tests may be required for verification and validation. 6.0 Perform TID testing on finished oscillators (if necessary) to gather data used for Worst-Case Analysis (WCA).
Design and test to show compliance to above specification limits:
Post TID Radiation test results shown below of a 20-Flat Pack 3.3Vdc Space clocks at 80.000MHz designed to meet the Radiation requirements.
Page | 6
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
1M
168 hr, 100°C
1M
168 hr, 100°C
600K
300K
200K
100K
50K
Pre‐Rad
2E12
79,999,500 79,999,400 79,999,300 79,999,200 79,999,100 79,999,000 79,998,900 79,998,800 79,998,700 79,998,600 Pre_Neu
Frequency in Hz
f0 Frequency (Vcc=3.3V) Pre‐rad Limit: ‐‐‐‐ to ‐‐‐‐Hz
Endpoints
3.67 3.57 3.47 3.37
Endpoints
Page | 7
600K
300K
200K
100K
50K
Pre‐Rad
2E12
3.27 3.17 3.07 2.97 Pre_Neu
Voltage in Volts
VOH Output Voltage (Vcc=3.3V) Pre‐rad Limit: 2.97 to ‐‐‐‐V
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
3.00
tR Rise Time (Vcc=3.3V) Pre‐rad Limit: ‐‐‐‐ to 3nS
2.50
Time in nS
0.330 0.280 0.230 0.180 0.130 0.080 0.030 ‐0.020 ‐0.070
2.00 1.50 1.00
168 hr,…
1M
600K
300K
200K
50K
Pre‐Rad
2E12
Pre_Neu
100K
0.00
168 hr, 100°C
1M
600K
300K
200K
100K
50K
Pre‐Rad
2E12
0.50 Pre_Neu
Voltage in Volts
VOL Output Voltage (Vcc=3.3V) Pre‐rad Limit: ‐‐‐‐ to 0.33V
Endpoints
Endpoints
3.00
Time in nS
2.50 2.00 1.00 0.50
168 hr, 100°C
1M
600K
300K
200K
100K
50K
Pre‐Rad
2E12
Pre_Neu
168 hr,…
1M
600K
300K
200K
100K
50K
Pre‐Rad
2E12
0.00
Endpoints
Page | 8
tF Fall Time (Vcc=3.3V) Pre‐rad Limit: ‐‐‐‐ to 3nS
1.50
60.00 55.00 50.00 45.00 40.00 Pre_Neu
Duty Cycle in %
DC Positive Duty Cycle (Vcc=3.3V) Pre‐rad Limit: 40 to 60%
Endpoints
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
NUCLEAR WEAPON ENVIRONMENTS The radiation from a nuclear consists primarily of photons (x-rays and γ-rays) and neutrons. The prompt radiation, which is emitted in less than 20ns, produces a transient ionization pulse known as a dose rate pulse. Q-Tech testing program on prompt dose latchup and upset on components and oscillators’ level is implemented. Dose rate testing is usually performed on an electron linear accelerator (LINAC) or a flash x-ray machine to determine the threshold dose rate for upset. Dose rate unit is rad/sec.
Page | 9
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Q-TECH IS A SUPPLIER FOR GPSIII SPACE CLOCK OSCILLATORS Q-Tech is a current supplier of all high-reliability space hybrid oscillators to the GPSIII program, that required the radiation quality conformance of all semiconductor devices and microcircuits shall be verified and maintained in order to guarantee survivability compliance throughout all flight units. The GPSIII Nuclear Hardness Assurance Program Plan (NHAP) 3GPS-PN-07-0014 by Lockheed Martin is consistent with the requirements with Appendix B of TOR-2006(1590)-4432, GPSIII Parts Materials and Process Control, Program Requirements, and Appendix A of TOR-2006(1590)-4430, GPSIII Technical Requirements for Electronic Parts, Materials and Processes. Figure below show an example of Q-Tech RLAT test plan for a NPN microwave transistor used in GPSIII space clock.
Page | 10
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Q-TECH RADIATION TESTING ACTIVITIES Q-Tech first design in Space is a 5.0Vdc TTL logic that uses a single NPN transistor 2N2222A Sprague driving a 8-input positive NAND gate TI. Q-Tech started evaluating active components Radiation hardness assurance through components testing or on oscillator level. First radiation tests were back in 1991 and continue until today. Q-Tech accumulated the Radiation library through direct testing, or partnering with our suppliers and customers. Today we have over hundreds of test results. TID (HDR) TEST RESULTS ON VARIOUS Q-TECH OSCILLATORS IN 1998
Page | 11
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
TYPICAL TEST TID (HDR) ON STANDARD SPACE CLOCKS
Page | 12
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
FLASH X-RAY TEST FOR DOSE RATE UPSET AND LATCHUP ON A SPACE CLOCK
Page | 13
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Single-event testing was conducted at the two cylotron facilties in TAMU and Berkeley, USA and Belgium. The test used 15MeV SEE beam to 40MeV beam range (low LET).
Page | 14
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
FIGURE SHOWING A CROSS SECTION OF SEE TESTS ON A QT88
Weibull Parameters and Rate Calculation for SEE in the QT88 Series Oscillators
LET(Threshold) (MeV-cm2/mg) Limiting Cross-section (cm2/device) Weibull Width (MeV-cm2/mg) Weibull Shape Depth (µm) Funnel (µm) ISS Nominal SEE Rate (upsets/device/day) GEO Nominal SEE Rate (upsets/device/day) Interplanetary Worst Week SEE Rate (upsets/device/day) Peak 5 Min SEE Rate (upsets/device/day)
Page | 15
100MHz Oscillator Module 20.7 2.1x10-5 18.5 1.5 1 0 1.54E-7 7.35E-7 4.87E-7 3.82E-6
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
FIGURE SHOWING DELTA hFE OF A MRFC901 MOTOROLANPN TRANSISTOR
EXAMPLE OF APPLYING LDR LINE REGULATION OF A CLASS S VOLTAGE REGULATOR HS-117RH INTO WORST-CASE ANALYSIS Supplier data sheet shows the voltage regulation of a Space regulator HS117-RH worst-case under Low Dose Rate TID test at ±0.2%/V. Q-Tech used the worst-case radiation test into simulation of the Space design. Parameters of semiconductors and microcircuits worst-case under radiation (hFE, frequency delta, Line regulation voltage, voltage offset, etc.) are used in the calculation of Worst-Case analyses.
Page | 16
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Page | 17
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Q-TECH RADIATION TESTING ON B+ OSCILLATORS Q-Tech launched the B+ qualified for space low orbit applications successfully in 2009. Q-Tech up screened and procured the 2.0µm CMOS FACT technology and the 1.3µm BiCMOS to MIL-PRF-38534, Class K with Radiation Lot Acceptance test (RLAT) covering the Total Ionizing Dose (TID) tests both on High Dose Rate (HDR) and Low Dose Rate (LDR), as well as Single-event effects (SEL, SEU). The B+ product line covered frequency as low as 15kHz to 220MHz in CMOS +2.5Vdc, +3.3Vdc, and +5Vdc, and LVDS from 40MHz to 350MHz at +2.5Vdc and +3.3Vdc. Radiation tests were conducted on each wafer lot with traceability down to wafer number.
Page | 18
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Page | 19
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Page | 20
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
In summary, Q-Tech has a strong radiation program of understanding the environment of space application, designing and building space level hybrid clock oscillators to meet or exceed the requirements. Radiation hardness testing provides a close simulation to natural space radiation environments. The radiation test is optional in subgroup 2 of MIL-PRF-55310 Group C tests and can be performed only if customers required. All questions or concerns over Radiation, please contact us at: Q-Tech Corporation 10150 Jefferson Blvd Culver City, CA 90232 USA www.q-tech.com Contact person: Richard L. Duong Director of Engineering and Radiation tests (310)836-7900 x 121 [email protected]
Page | 21
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
APPENDIX Q-TECH RADIATION TESTS (EXTRACT OF LISTINGS)
Page | 22
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Page | 23
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
APPLICATION NOTES QTAN‐110
SPACE PRODUCTS HISTORY Q-Tech Corporation was founded in 1972 a manufacturer of high reliability hybrid clock oscillators. In 1985, Q-Tech decided to enter the Space applications market and received its first order for the MILSTAR program. In fact, Q-Tech went on to receive the TRW “Supplier of the Year Award” for the next two years in a row. In 1994, Q-Tech became the major supplier of hybrid crystal oscillators to virtually every satellite manufacturer in the United States. In 1999, Q-Tech received JPL/NASA award for its contribution to the Cassini program. Today up to date 2014, Q-Tech has 29 years serving the Space market and has grown far with design experience, excellent quality, numerous records of flight history, and lots of new products launched.
Page | 2
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Q-TECH RADIATION HARDNESS ASSURANCE PLAN 1.0 QUALIFICATION 1.1 All active EEE components possessed radiation (Total Ionizing Dose, Displacement Damage, and Single Event Effects) characterization data on parts representative of the flight lot devices in the flight application.
2.0 TOTAL IONIZING DOSE TESTING 2.1 Total Ionizing dose (TID) is the absorbed dose in a given material resulting from the energy deposition of ionizing radiation. TID is a measure of the energy deposited in a medium by ionizing radiation per unit mass. 2.2 Total Ionizing dose (TID) is a long-term failure mechanism versus SEE which is an instantaneous failure mechanism. 2.3 Total Ionizing dose testing is conducted in accordance with MIL-STD-883 test method 1019.7 or MIL-STD-750 test method 1019.5. 2.4 Test conditions represent the worst-case conditions in the intended application, typically 2X margin. 2.5 For linear bipolar integrated circuits and semiconductors which are potentially ELDRS-susceptible devices, test is conducted at 0.001Rad(Si)/s to 0.1Rad(Si)/s up to 50kRad(Si) or 100kRad(Si), both powered and unpowered.
Page | 3
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
3.0 DISPLACEMENT DAMAGE TESTING 3.1 Displacement damage (DD) is the result of nuclear interactions, typically scattering, which cause lattice defects. Protons can cause displacement damage in bipolar devices. Displacement damage is due to cumulative long-term non-ionizing dose damage from protons, electrons, and neutrons. The collision between an incoming particle and a lattice atom subsequently displaces the atom from its original lattice position. 3.2 Displacement damage testing is conducted in accordance with MIL-STD-750 test method 1017.1 or MIL-STD-883 test method 1017.2. 3.3 Neutron displacement damage or Proton displacement damage can be characterized with conversion to the equivalent 1MeV neutron damage fluence.
4.0 COMBINED TOTAL IONIZING DOSE AND DISPLACEMENT DAMAGE EFFECTS 4.1 If separate samples are used for total ionizing dose and displacement damage, the effects are combined analytically as described in MIL-HBK-814. 4.2 The samples may be used for both displacement damage and ionizing dose testing provided displacement damage (neutron) testing is done prior to total ionizing dose testing.
5.0 PARTS DEGRADED DESIGN LIMITS 5.1 Parts degraded design limits of data shall be based on MIL-HBK-814 to ensure that the lots will meet a 0.99/90 (99% of the population at 90% confidence level) statistical criteria. Special GPSIII design limits required a 0.9999/90 (99.99% and 90% confidence).
6.0 SINGLE EVENT EFECTS (SEE) TESTING 6.1 Active EEE components used in space orbits that are potentially susceptible to single event effects are required data tested adequate to calculate the single event effects rate in the intended applications. 6.2 A single event effect (SEE) is a disturbance to the normal operation of a circuit caused by the passage of a single ion through or near a sensitive node in a circuit. SEE can be either destructive or non-destructive. Destructive SEE include single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR). Non-destructive SEE include single-event upsets (SEU), single-event transients (SET), and single-event functional interrupts (SEFI). 6.3 Heavy ions testing for single event latch-up, burnout, transient, and upset. Appropriate bias and operating conditions: worst-case biasing and temperature for latchup, burnout. For single event upset, transient, the bias and operating conditions are lowest operating voltage and room temperature ambient. 6.4 Energy loss measure – Linear Energy Transfer (LET): Measure of energy deposition in a material, e.g. silicon. Unit of LET is MeV per mg/cm2 (energy per areal density). 6.5 Cross section is a measure of susceptibility, and unit is cm2 (area).
Page | 4
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Page | 5
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Q-TECH DESIGN CRITERIA TO MEET RADIATION SPECIFICATION LIMITS 1.0 Review each of the customers’ Radiation Hardness requirements. Try to ensure mission parameters such as reliability, availability, operate-through, and lifetime are met. See examples in Figures below. 2.0 Personnel involved included radiation engineer, reliability engineer, component engineer, and design engineer. 3.0 Apply design guidelines and derating for Radiation assurance margin. 4.0 Procure EEE active components with RHA level adequate for the application. Searches for available radiation hardened components that meet the requirement. Searches for commercial alternatives that could be up screened. 5.0 Obtain radiation test data from supplier on components level. Additional tests may be required for verification and validation. 6.0 Perform TID testing on finished oscillators (if necessary) to gather data used for Worst-Case Analysis (WCA).
Design and test to show compliance to above specification limits:
Post TID Radiation test results shown below of a 20-Flat Pack 3.3Vdc Space clocks at 80.000MHz designed to meet the Radiation requirements.
Page | 6
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
1M
168 hr, 100°C
1M
168 hr, 100°C
600K
300K
200K
100K
50K
Pre‐Rad
2E12
79,999,500 79,999,400 79,999,300 79,999,200 79,999,100 79,999,000 79,998,900 79,998,800 79,998,700 79,998,600 Pre_Neu
Frequency in Hz
f0 Frequency (Vcc=3.3V) Pre‐rad Limit: ‐‐‐‐ to ‐‐‐‐Hz
Endpoints
3.67 3.57 3.47 3.37
Endpoints
Page | 7
600K
300K
200K
100K
50K
Pre‐Rad
2E12
3.27 3.17 3.07 2.97 Pre_Neu
Voltage in Volts
VOH Output Voltage (Vcc=3.3V) Pre‐rad Limit: 2.97 to ‐‐‐‐V
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
3.00
tR Rise Time (Vcc=3.3V) Pre‐rad Limit: ‐‐‐‐ to 3nS
2.50
Time in nS
0.330 0.280 0.230 0.180 0.130 0.080 0.030 ‐0.020 ‐0.070
2.00 1.50 1.00
168 hr,…
1M
600K
300K
200K
50K
Pre‐Rad
2E12
Pre_Neu
100K
0.00
168 hr, 100°C
1M
600K
300K
200K
100K
50K
Pre‐Rad
2E12
0.50 Pre_Neu
Voltage in Volts
VOL Output Voltage (Vcc=3.3V) Pre‐rad Limit: ‐‐‐‐ to 0.33V
Endpoints
Endpoints
3.00
Time in nS
2.50 2.00 1.00 0.50
168 hr, 100°C
1M
600K
300K
200K
100K
50K
Pre‐Rad
2E12
Pre_Neu
168 hr,…
1M
600K
300K
200K
100K
50K
Pre‐Rad
2E12
0.00
Endpoints
Page | 8
tF Fall Time (Vcc=3.3V) Pre‐rad Limit: ‐‐‐‐ to 3nS
1.50
60.00 55.00 50.00 45.00 40.00 Pre_Neu
Duty Cycle in %
DC Positive Duty Cycle (Vcc=3.3V) Pre‐rad Limit: 40 to 60%
Endpoints
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
NUCLEAR WEAPON ENVIRONMENTS The radiation from a nuclear consists primarily of photons (x-rays and γ-rays) and neutrons. The prompt radiation, which is emitted in less than 20ns, produces a transient ionization pulse known as a dose rate pulse. Q-Tech testing program on prompt dose latchup and upset on components and oscillators’ level is implemented. Dose rate testing is usually performed on an electron linear accelerator (LINAC) or a flash x-ray machine to determine the threshold dose rate for upset. Dose rate unit is rad/sec.
Page | 9
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Q-TECH IS A SUPPLIER FOR GPSIII SPACE CLOCK OSCILLATORS Q-Tech is a current supplier of all high-reliability space hybrid oscillators to the GPSIII program, that required the radiation quality conformance of all semiconductor devices and microcircuits shall be verified and maintained in order to guarantee survivability compliance throughout all flight units. The GPSIII Nuclear Hardness Assurance Program Plan (NHAP) 3GPS-PN-07-0014 by Lockheed Martin is consistent with the requirements with Appendix B of TOR-2006(1590)-4432, GPSIII Parts Materials and Process Control, Program Requirements, and Appendix A of TOR-2006(1590)-4430, GPSIII Technical Requirements for Electronic Parts, Materials and Processes. Figure below show an example of Q-Tech RLAT test plan for a NPN microwave transistor used in GPSIII space clock.
Page | 10
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Q-TECH RADIATION TESTING ACTIVITIES Q-Tech first design in Space is a 5.0Vdc TTL logic that uses a single NPN transistor 2N2222A Sprague driving a 8-input positive NAND gate TI. Q-Tech started evaluating active components Radiation hardness assurance through components testing or on oscillator level. First radiation tests were back in 1991 and continue until today. Q-Tech accumulated the Radiation library through direct testing, or partnering with our suppliers and customers. Today we have over hundreds of test results. TID (HDR) TEST RESULTS ON VARIOUS Q-TECH OSCILLATORS IN 1998
Page | 11
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
TYPICAL TEST TID (HDR) ON STANDARD SPACE CLOCKS
Page | 12
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
FLASH X-RAY TEST FOR DOSE RATE UPSET AND LATCHUP ON A SPACE CLOCK
Page | 13
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Single-event testing was conducted at the two cylotron facilties in TAMU and Berkeley, USA and Belgium. The test used 15MeV SEE beam to 40MeV beam range (low LET).
Page | 14
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
FIGURE SHOWING A CROSS SECTION OF SEE TESTS ON A QT88
Weibull Parameters and Rate Calculation for SEE in the QT88 Series Oscillators
LET(Threshold) (MeV-cm2/mg) Limiting Cross-section (cm2/device) Weibull Width (MeV-cm2/mg) Weibull Shape Depth (µm) Funnel (µm) ISS Nominal SEE Rate (upsets/device/day) GEO Nominal SEE Rate (upsets/device/day) Interplanetary Worst Week SEE Rate (upsets/device/day) Peak 5 Min SEE Rate (upsets/device/day)
Page | 15
100MHz Oscillator Module 20.7 2.1x10-5 18.5 1.5 1 0 1.54E-7 7.35E-7 4.87E-7 3.82E-6
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
FIGURE SHOWING DELTA hFE OF A MRFC901 MOTOROLANPN TRANSISTOR
EXAMPLE OF APPLYING LDR LINE REGULATION OF A CLASS S VOLTAGE REGULATOR HS-117RH INTO WORST-CASE ANALYSIS Supplier data sheet shows the voltage regulation of a Space regulator HS117-RH worst-case under Low Dose Rate TID test at ±0.2%/V. Q-Tech used the worst-case radiation test into simulation of the Space design. Parameters of semiconductors and microcircuits worst-case under radiation (hFE, frequency delta, Line regulation voltage, voltage offset, etc.) are used in the calculation of Worst-Case analyses.
Page | 16
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Page | 17
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Q-TECH RADIATION TESTING ON B+ OSCILLATORS Q-Tech launched the B+ qualified for space low orbit applications successfully in 2009. Q-Tech up screened and procured the 2.0µm CMOS FACT technology and the 1.3µm BiCMOS to MIL-PRF-38534, Class K with Radiation Lot Acceptance test (RLAT) covering the Total Ionizing Dose (TID) tests both on High Dose Rate (HDR) and Low Dose Rate (LDR), as well as Single-event effects (SEL, SEU). The B+ product line covered frequency as low as 15kHz to 220MHz in CMOS +2.5Vdc, +3.3Vdc, and +5Vdc, and LVDS from 40MHz to 350MHz at +2.5Vdc and +3.3Vdc. Radiation tests were conducted on each wafer lot with traceability down to wafer number.
Page | 18
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Page | 19
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Page | 20
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
In summary, Q-Tech has a strong radiation program of understanding the environment of space application, designing and building space level hybrid clock oscillators to meet or exceed the requirements. Radiation hardness testing provides a close simulation to natural space radiation environments. The radiation test is optional in subgroup 2 of MIL-PRF-55310 Group C tests and can be performed only if customers required. All questions or concerns over Radiation, please contact us at: Q-Tech Corporation 10150 Jefferson Blvd Culver City, CA 90232 USA www.q-tech.com Contact person: Richard L. Duong Director of Engineering and Radiation tests (310)836-7900 x 121 [email protected]
Page | 21
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
APPENDIX Q-TECH RADIATION TESTS (EXTRACT OF LISTINGS)
Page | 22
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
Page | 23
Q-TECH CORPORATION RADIATION HARDNESS ASSURANCE PROGRAM
