Ossila Probe Station
Ossila Probe Station Our new multi-purpose probe station, to simplify and speed up the measurement process. By using interchangeable probes, pre-aligned for a variety of substrate architectures, it becomes quicker and easier to connect to devices. The use of gold-coated spring-loaded connectors provides a revolution in contact ease by ensuring robust electromechanical connections while massively reducing substrate damage often caused by conventional probes.
Overview Designed for organic electronics We've re-designed the probe station for the world of organic electronics where delicate coatings require low-force, reliable contacts.
Great substrate contact The gold-coated spring-loaded probes provide a constant pressure to the substrate reducing or eliminating the 'destructive testing' often caused by the electro-mechanical contacts from standard probes.
Easy alignment By pre-aligning the probes and substrate we significantly reduce the time and difficulty of aligning the system. Our current range of interchangeable probes work for our low density and high density OFET system. We also offer a four point probe for conductivity and custom probes are also available for most applications.
Precision Alignment The use of high quality optomechanical components with 1 um readability micrometers (10 um repeatability) allows accurate positioning of the probes.
Small form factor Small is beautiful as they say and we've designed our probe station to be as compact and easy to use as possible. It's specifically designed for use in glove boxes where movement and dexterity are impaired.
Standard connectors The use of standardised BNC connectors makes it easy to connect to a wide range of test equipment and minimises the cost and complexity of inter-series adapters.
Contact us to find out more: Call: 0114 213 2770 Ossila Ltd
I
I
Email: [email protected] www.ossila.com
I
[email protected]
I
+44 (0)114 213 2770
Overview Designed for organic electronics We've re-designed the probe station for the world of organic electronics where delicate coatings require low-force, reliable contacts.
Great substrate contact The gold-coated spring-loaded probes provide a constant pressure to the substrate reducing or eliminating the 'destructive testing' often caused by the electro-mechanical contacts from standard probes.
Easy alignment By pre-aligning the probes and substrate we significantly reduce the time and difficulty of aligning the system. Our current range of interchangeable probes work for our low density and high density OFET system. We also offer a four point probe for conductivity and custom probes are also available for most applications.
Precision Alignment The use of high quality optomechanical components with 1 um readability micrometers (10 um repeatability) allows accurate positioning of the probes.
Small form factor Small is beautiful as they say and we've designed our probe station to be as compact and easy to use as possible. It's specifically designed for use in glove boxes where movement and dexterity are impaired.
Standard connectors The use of standardised BNC connectors makes it easy to connect to a wide range of test equipment and minimises the cost and complexity of inter-series adapters.
Contact us to find out more: Call: 0114 213 2770 Ossila Ltd
I
I
Email: [email protected] www.ossila.com
I
[email protected]
I
+44 (0)114 213 2770
